HOME > Presentation > DetailCathodoluminescence study of stacking faults and dislocations in bulk GaNイ ウェイ, 陳 君, 伊藤俊, 湯 代明, ジョ ユージン, 大島 祐一, 関口 隆史. 19th International Microscopy Congress. 2018.NIMS author(s)YI, WeiCHEN, JunTANG, DaimingCHO, YujinOSHIMA, YuichiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2018-08-30 16:22:43 +0900Updated at: 2018-08-30 16:22:43 +0900