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電子線誘起電流法によるGaN Schottky領域の転位と電流リーク箇所の観察
(EBIC Investigation of Dislocations and Leakage Sites in GaN Schottky Diode)
第65回応用物理学会春季学術講演会. March 17, 2018-March 20, 2018.
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Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2018-03-15 22:37:43 +0900 Updated at: 2018-06-05 14:19:03 +0900