HOME > Presentation > Detail(Direct observation of electronic states in gate stack structures: XPS under device operation)山下 良之, 吉川 英樹, 知京 豊裕, 小林 啓介. 19th International Vacuum Congress IVC-19. 2013.NIMS author(s)YAMASHITA, YoshiyukiYOSHIKAWA, HidekiCHIKYO, ToyohiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:35:02 +0900Updated at: 2017-07-10 21:42:31 +0900