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(Characterization of high-k dielectric films for MOSFET using Electron Beam Induced Current)
IUMRS-ICA 2010. September 25, 2010-September 28, 2010. Invited
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Created at: 2017-01-08 04:53:11 +0900 Updated at: 2024-03-05 11:43:06 +0900