HOME > Presentation > Detail(Photoelectron Spectroscopic Study on High-k Dielectrics Based ReRAM Structure under Bias Operation)長田 貴弘, 山下 良之, 吉川 英樹, 小林 啓介, 知京 豊裕. 2013 NIMS CONFERENCE . 2013. InvitedNIMS author(s)NAGATA, TakahiroYAMASHITA, YoshiyukiYOSHIKAWA, HidekiCHIKYO, ToyohiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at :2017-02-14 11:27:50 +0900 Updated at :2024-03-05 11:44:37 +0900