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(Photoelectron Spectroscopic Study on High-k Dielectrics Based ReRAM Structure under Bias Operation)

2013 NIMS CONFERENCE . 2013. Invited

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at :2017-02-14 11:27:50 +0900 Updated at :2024-03-05 11:44:37 +0900

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