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(Photoelectron Spectroscopic Study on High-k Dielectrics Based ReRAM Structure under Bias Operation)
2013 NIMS CONFERENCE . July 01, 2013-July 03, 2013. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:27:50 +0900 Updated at: 2024-03-05 11:44:37 +0900