HOME > Presentation > DetailThe influence of interface states on the CaF2/p-GaN metal-insulator-semiconductor capacitorsサン リウエン, 廖 梅勇, 角谷 正友, 小出 康夫. International Conference on Defects in Semiconductors(CDS) 2017. 2017.NIMS author(s)SANG, LiwenLIAO, MeiyongSUMIYA, MasatomoKOIDE, YasuoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-09-07 00:22:52 +0900Updated at: 2018-06-05 14:12:31 +0900