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STMによるGaAs中N不純物準位の直接可視化
(Direct visualization of N impurity state in GaAs using STM)
22nd International Colloquium on Scanning Probe Microscopy. December 11, 2014-December 13, 2014.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:12:05 +0900 Updated at: 2017-07-10 22:02:12 +0900