HOME > Presentation > Detail断面STMによるGaAs中窒素不純物の直接可視化(Direct visualization of the N impurity state in dilute GaNAs using cross-sectional scanning tunneling microscopy)石田 暢之, 定昌史, 間野 高明, 野田 武司, 佐久間 芳樹, 藤田 大介. ISPlasma2016/IC-PLANTS2016. March 06, 2016-March 10, 2016.NIMS author(s)ISHIDA, NobuyukiMANO, TakaakiNODA, TakeshiSAKUMA, YoshikiFUJITA, DaisukeFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 04:54:35 +0900Updated at: 2017-07-10 22:16:28 +0900