HOME > Presentation > DetailSTMによるGaAs中N不純物準位の直接可視化(Direct visualization of N impurity state in GaAs using STM)石田 暢之, 定昌史, 間野 高明, 野田 武司, 佐久間 芳樹, 藤田 大介. The 7th International Symposium on Surface Science. November 02, 2014-November 06, 2014.NIMS author(s)ISHIDA, NobuyukiMANO, TakaakiNODA, TakeshiSAKUMA, YoshikiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 03:40:35 +0900 Updated at: 2017-07-10 21:56:42 +0900