Study on interface structure of CeF3/Ge stack structure by hard x-ray photoelectron spectroscopy
7th International Conference on Hard X-Ray Photoelectron Spectro. 2017.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-07-20 22:31:47 +0900更新時刻: 2018-06-05 14:10:51 +0900