SAMURAI - NIMS Researchers Database

HOME > Presentation > Detail

Study on interface structure of CeF3/Ge stack structure by hard x-ray photoelectron spectroscopy

7th International Conference on Hard X-Ray Photoelectron Spectro. 2017.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at :2017-07-20 22:31:47 +0900 Updated at :2018-06-05 14:10:51 +0900

    ▲ Go to the top of this page