HOME > Presentation > Detail(Bias-application in Hard X-ray Photoelectron Spectroscopy for Characterization of Advanced Materials)山下 良之, 長田 貴弘, 吉川 英樹, 知京 豊裕, 小林 啓介. European Conference on Surface Science. 2011.NIMS author(s)YAMASHITA, YoshiyukiNAGATA, TakahiroYOSHIKAWA, HidekiCHIKYO, ToyohiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 03:41:19 +0900Updated at: 2017-07-10 21:10:31 +0900