Surface and oxide interface characterization of n and p-GaN for power electronics
19th International Conference on Defects - Recognition, Imaging and Physics in Semiconductors: DRIP XIX. 2022. 招待講演
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2022-10-18 03:24:11 +0900更新時刻: 2024-03-05 12:22:00 +0900