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Surface and oxide interface characterization of n and p-GaN for power electronics
19th International Conference on Defects - Recognition, Imaging and Physics in Semiconductors: DRIP XIX. August 29, 2022-September 01, 2022. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2022-10-18 03:24:11 +0900 Updated at: 2024-03-05 12:22:00 +0900