Characterization of p-n junctions in wide-gap semiconductors using a cathodoluminescence/electron-beam-induced current technique
| 著者 | SEKIGUCHI, Takashi, Yuan, Xiaoli, KOIZUMI, Satoshi, TANIGUCHI, Takashi. |
|---|---|
| 出版社名 | Beam Injection Based Nanocharacterization of Advanced Materials |
| 発表年 | 2008 |
| ページ数 | 14 |
| 言語 | English |
| ISBN |