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Characterization of p-n junctions in wide-gap semiconductors using a cathodoluminescence/electron-beam-induced current technique

SEKIGUCHI, Takashi, Yuan, Xiaoli, KOIZUMI, Satoshi, TANIGUCHI, Takashi.
/books?q=book_title_text%3A%22%22 139-152. 2008.

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    Created at: 2022-09-05 12:03:59 +0900Updated at: 2022-09-05 12:03:59 +0900

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