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論文・分野から探す

機構に所属する研究者の発表した論文を、タイトル・抄録・分野などから検索することができます。論文の分野はクラリベイト社のESI分類を参考に分類しています(Materials Science, Physics, Chemistry, Engineering, Biologyなど)。

最終更新日: 2024年04月27日

8件の論文が見つかりました。論文は出版年月日順に表示しています。(ヘルプ)
  • Yali Dong, Hideki Kakisawa, Yutaka Kagawa. Optical system for microscopic observation and strain measurement at high temperature. Measurement Science and Technology. 25 [2] (2014) 025002 10.1088/0957-0233/25/2/025002
  • Koji Matsumura, Takaya Fujita, Hiroshi Itoh, Daisuke Fujita. Characterization of carrier concentration in CIGS solar cells by scanning capacitance microscopy. Measurement Science and Technology. 25 [4] (2014) 044020 10.1088/0957-0233/25/4/044020
  • Takaya Fujita, Koji Matsumura, Hiroshi Itoh, Daisuke Fujita. Analytical procedure for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy. Measurement Science and Technology. 25 [4] (2014) 044021 10.1088/0957-0233/25/4/044021
  • Y Tsuchiya, H Suzuki, T Umeno, S Machiya, K Osamura. Development of a cryogenic load frame for a neutron diffractometer. Measurement Science and Technology. 21 [2] (2010) 025904 10.1088/0957-0233/21/2/025904
  • A BenMoussa, U Schühle, F Scholze, U Kroth, K Haenen, T Saito, J Campos, S Koizumi, C Laubis, M Richter, V Mortet, A Theissen, J F Hochedez. Radiometric characteristics of new diamond PIN photodiodes. Measurement Science and Technology. 17 [4] (2006) 913-917 10.1088/0957-0233/17/4/042
  • S Meguro, T Ohnishi, M Lippmaa, H Koinuma. Elements of informatics for combinatorial solid-state materials science. Measurement Science and Technology. 16 [1] (2005) 309-316 10.1088/0957-0233/16/1/041
  • Shin-ichi Todoroki. Object-oriented virtual sample library: a container of multi-dimensional data for acquisition, visualization and sharing. Measurement Science and Technology. 16 [1] (2005) 285-291 10.1088/0957-0233/16/1/037 Open Access
  • Y Yamauchi, M Kurahashi, N Kishimoto. Metastable helium atom source directly pulsed by a nozzle-skimmer discharge. Measurement Science and Technology. 9 [3] (1998) 531-533 10.1088/0957-0233/9/3/030
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