| 49734件の論文が見つかりました。論文は出版年月日順に表示しています。（ヘルプ） | |
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| K. Miyazawa, H. Satsuki, M. Kuwabara, M. Akaishi. Microstructural analysis of high-pressure compressed C60. Journal of Materials Research. 16 [07] (2001) 1960-1966 10.1557/jmr.2001.0268 | |
| Y. H. Gao, Y. Bando, T. Sato. Nanobelts of the dielectric material Ge3N4. Applied Physics Letters. 79 [27] (2001) 4565-4567 10.1063/1.1428634 | |
| T. Mori. Investigation of superconductivity in BeB2 synthesized by the solid state reaction method. JOURNAL OF MATERIALS SCIENCE LETTERS. 20 (2001) 1857-1858 10.1023/a:1012885103406 | |
| Yasumichi Matsumoto, Asami Funatsu, Dan Matsuo, Ugur Unal, Kiyoshi Ozawa. Electrochemistry of titanate(IV) layered oxides. The Journal of Physical Chemistry B. 105 [44] (2001) 10893-10899 10.1021/jp012161a | |
| Ying Shi, ARAKI, Hiroshi, Wen Yang, 野田哲二. Influence of fiber pre-coating on mechanical properties and interfacial structures of SiC(f)/SiC composites. JOURNAL OF INORGANIC MATERIALS. 16 [5] (2001) 883-888 | |
| H. Yasuda, K. Mitsuishi, H. Mori. Particle-size dependence of phase stability and amorphouslike phase formation in nanometer-sized Au-Sn alloy particles. Physical Review B. 64 [9] (2001) 094101 10.1103/physrevb.64.094101 | |
| MITSUISHI, Kazutaka, TAKEGUCHI, Masaki, 保田英洋, FURUYA, Kazuo. New Scheme of Calculation of Annular Dark-Field STEM Image Including Both Elastically Diffracted and TDS Waves. JOURNAL OF ELECTRON MICROSCOPY. 50 [3] (2001) 157-162 | |
| Fuxiang Zhang, Fangfang Xu, Andreas Leithe-Jasper, Takao Mori, Takaho Tanaka, Jun Xu, Akira Sato, Yashio Bando, Yashio Matsui. Homologous phases built by boron clusters and their vibrational properties. Inorganic Chemistry. 40 [27] (2001) 6948-6951 10.1021/ic010527s | |
| A Urbieta, P Fernández, J Piqueras, T Sekiguchi. Scanning tunnelling spectroscopy characterization of ZnO single crystals. Semiconductor Science and Technology. 16 [7] (2001) 589-593 10.1088/0268-1242/16/7/311 | |
| M. Mitome, M. Okamoto, Y. Bando, H. Yamamura. Structure analysis of Ba2In2O5 and related compounds by elecron microscopy. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 19 [6] (2001) 2284 10.1116/1.1421566 | |
