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Last updated: May 01, 2024
| 93 article(s) found. Sorted by publication dates. (Help) | |
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| M. Yoshitake, A. Thananan, T. Aizawaki, K. Yoshihara. micro-XPS analysis of TiN with/without Cl implantation. Surface and Interface Analysis. 34 [1] (2002) 698-702 10.1002/sia.1391 | |
| 吉原一紘. Summary of ISO/TC201 Standarad: ISO14975:2000-Surface Chemical Analysis -Data information formats. Surface and Interface Analysis. (2001) | |
| 吉原一紘, 田中彰博. Interlaboratory Study on the Degradation of Organic Materials by X-rays in XPS. Surface and Interface Analysis. (2001) | |
| TAKEGUCHI, Masaki, TANAKA, Miyoko, 保田英洋, FURUYA, Kazuo. Analytical ultrahigh-vacuum transmission electron microscopy applied to the study of Pd2Si island formation on Si (111) surfaces. Journal of surface and interface analysis. (2001) 68-72 | |
| 浅見勝彦, AKIYAMA, Eiji, 橋本功二. Angle-resolved XPS for determination of diffusion coefficients and mobilities of cations in thin passive films. Surface and Interface Analysis. (2000) 106-111 | |
| 竹口雅樹, 呉源, 古屋一夫. Atomic structure of steps on Si(113)surface studied by direct HRTEM observation. Surface and Interface Analysis. (2000) 288-291 | |
| Daisuke Fujita, 吉原一紘, 吉原一紘, Kazuhiro Yoshihara. Parctical Energy Scale Calibration Procedure for Auger Electron Spectrometers Using a Spectrometer Offset Function.. Surface and Interface Analysis. 21 [4] (1994) 226-230 10.1002/sia.740210403 | |
| 吉原一紘, D.W.Moon, K. Yoshihara, D. W. Moon, D. Fujita, K. J. Kim, K. Kajiwara. GaAs/AlAs Superlattice as a Proposed New Reference Material for the Sputter Depth Profiling.. Surface and Interface Analysis. 20 [13] (1993) 1061-1066 10.1002/sia.740201306 | |
| . . Surface and Interface Analysis. 18 (1992) 18 | |
| 吉原一紘, M. Yoshitake, VAMAS-SCA Commuity, K. Yoshihara, Vamas-Sca Community. A Common Data Processing System for Surface Analysis.. Surface and Interface Analysis. 18 [10] (1992) 724-728 10.1002/sia.740181006 | |
