| 93 article(s) found. Sorted by publication dates. (Help) | |
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| HASEGAWA, Akira, MITSUISHI, Kazutaka, TAKEGUCHI, Masaki, FURUYA, Kazuo, Robert C. Birtcher. Time-resolved measurement of X-ray emission from Al2O3 targets induced by low-energy ion bombardment. SURFACE AND INTERFACE ANALYSIS. (2006) 1641-1645 | |
| YOSHITAKE, Michiko, SONG, Weijie. Fabrication of epitaxial MIM structures on NiAl(110) studied by XPS and low energy electron diffraction . SURFACE AND INTERFACE ANALYSIS. (2006) 769-722 | |
| SONG, Weijie, YOSHITAKE, Michiko. A Work Function Study of Ultra-thin Alumina Formation on Cu-9%Al(111) Surface. SURFACE AND INTERFACE ANALYSIS. (2006) 793-796 | |
| SUN, Xia, 丁沢軍, YAMAUCHI, Yasushi. Analysis of the Spin-Polarization of Secondary Electrons Emitted from Ferromagnetic Materials. SURFACE AND INTERFACE ANALYSIS. (2006) 668-671 | |
| Y. Suzuki, Y. Sumi, K. Kita, T. Miyanaga, K. Sagisaka. Influence of local structure on local electric field in island-like silver films. Surface and Interface Analysis. 38 [9] (2006) 1296-1301 10.1002/sia.2443 | |
| Isao Sakaguchi, Haruki Ryoken, Tsubasa Nakagawa, Yoshiyuki Sato, Hajime Haneda. Luminescence properties of Cu-ion-implnated and annealed ZnO thin films deposited by chemical vapor deposition and pulsed laser deposition. Surface and Interface Analysis. 38 [1] (2006) 1-5 10.1002/sia.2124 | |
| A. Jablonski, S. Tanuma, C. J. Powell. New universal expression for the electron stopping power for energies between 200 eV and 30 keV. Surface and Interface Analysis. 38 [2] (2006) 76-83 10.1002/sia.2202 | |
| S. Tanuma. Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 - Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy. Surface and Interface Analysis. 38 [3] (2006) 178-180 10.1002/sia.2177 Open Access | |
| TANAKA, Miyoko, SHIMOJO, Masayuki, HAN, MING, MITSUISHI, Kazutaka, FURUYA, Kazuo. Electron Beam Induced Deposition of Nano-Structures with Transmission Electron Microscopy. SURFACE AND INTERFACE ANALYSIS. (2005) 261-264 | |
| H. Yanagisawa, T. Tanaka, Y. Ishida, M. Matsue, E. Rokuta, S. Otani, C. Oshima. Analysis of phonons in graphene sheets by means of HREELS measurement andab initio calculation. Surface and Interface Analysis. 37 [2] (2005) 133-136 10.1002/sia.1948 | |
