| 9920件の論文が見つかりました。論文は出版年月日順に表示しています。（ヘルプ） | |
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| T Akahane. An electrostatically-focussed positron beam for surface studies. Applied Surface Science. 149 [1-4] (1999) 54-60 10.1016/s0169-4332(99)00172-5 | |
| 平野 敏幸, 出村 雅彦, D.Golberg, D Golberg. 化学量論組成Ni3Alの降伏応力逆温度依存領域におけるシュミット則成立について. Acta Materialia. 47 [12] (1999) 3441-3446 10.1016/s1359-6454(99)00202-5 | |
| Kiflawi, H.Kand, I. Kiflawi, G. Davies, D. Fisher, H. Kanda. New infra-red absorption centres in electron irradiated and annealed type Ia diamonds. Diamond and Related Materials. 8 [8-9] (1999) 1576-1580 10.1016/s0925-9635(99)00067-9 | |
| Michiko Yoshitake, Kazuhiro Yoshihara. Measurement of work function change with surface segregation of substrate element on a deposited film. Applied Surface Science. 146 [1-4] (1999) 97-100 10.1016/s0169-4332(99)00039-2 | |
| M Murayama, K Hono. Pre-precipitate clusters and precipitation processes in Al-Mg-Si alloys. Acta Materialia. 47 [5] (1999) 1537-1548 10.1016/s1359-6454(99)00033-6 | |
| 湯鋒, Satoshi Emura, Masuo Hagiwara, Feng Tang. Modulated microstructure in Ti-22Al-11 Nb-4Mo alloy. Scripta Materialia. 40 [4] (1999) 471-476 10.1016/s1359-6462(98)00441-2 | |
| MITARAI, Yoko, HARADA, Hiroshi, RO, Yoshikazu, 丸子智弘, 丸子智弘. Microstructure dependence of strength of Ir-base refractory superalloys. Intermetallics. 40 [1] (1999) 109-115 | |
| K Tsuzaki, 佐藤英一, 振本昌治, 古原忠, 牧正志, E Sato, S Furimoto, T Furuhara, T Maki. Formation of an (α+θ) microduplex structure without thermomechanical processing in superplastic ultrahigh carbon steels. Scripta Materialia. 40 [6] (1999) 675-681 10.1016/s1359-6462(98)00486-2 | |
| Miyoko Tanaka, Kazuo Furuya, Masaki Takeguchi, Toshikazu Honda. Surface observation of Mo nanocrystals deposited on Si (111) thin films by a newly developed ultrahigh vacuum field-emission transmission electron microscope. Thin Solid Films. 319 [1-2] (1998) 110-114 10.1016/s0040-6090(97)01097-3 | |
| 田中美代子, 古屋一夫, 齋藤鐵哉, Miyoko Tanaka, Kazuo Furuya, Tetsuya Saito. Focused Ion Beam Interfaced with a 200 keV Transmission Electron
Microscope for In Situ Micropatterning on Semiconductors. Microscopy and Microanalysis. 4 [3] (1998) 207-217 10.1017/s1431927698980205 | |
