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(Invited) Electrical Integrity and Anisotropy in Dielectric Breakdown of Layered h -BN Insulator
(Electrical Integrity and Anisotropy in Dielectric Breakdown of Layered h-BN Insulator)

Kosuke Nagashio, Yoshiaki Hattori, Nobuaki Takahashi, Takashi Taniguchi, Kenji Watanabe, Jianfeng Bao, Wataru Norimatsu, Michiko Kusunoki.
ECS Transactions 79 [1] 91-97. 2017.
https://doi.org/10.1149/07901.0091ecst

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    作成時刻: 2017-07-05 22:41:04 +0900更新時刻: 2024-03-30 02:28:30 +0900

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