SAMURAI - NIMS Researchers Database

HOME > 論文 > 詳細

論文の表示

著者名Jun Chen, Wei Yi, Ashutosh Kumar, Akio Iwanade, Ryo Tanaka, Shinya Takashima, Masaharu Edo, Shun Ito, Takashi Kimura, Tadakatsu Ohkubo, Takashi Sekiguchi.
タイトルElectron-Beam-Induced Current Study of Dislocations and Leakage Sites in GaN Schottky Barrier Diodes
掲載誌名Journal of Electronic Materials 49 [9] 5196-5204
ISSN: 03615235
ESIでのカテゴリ: MATERIALS SCIENCE
出版社Springer Science and Business Media LLC
発表年2020
言語English
DOIhttps://doi.org/10.1007/s11664-020-08081-2
この文献をMendeleyにインポートMendeley

▲ページトップへ移動