SAMURAI - NIMS Researchers Database

NIMS Award Symposium 2026

HOME > Article > Detail

Effect of Introducing β-FeSi2Template Layers on Defect Density and Minority Carrier Diffusion Length in Si Region near p-β-FeSi2/n-Si Heterointerface
(Effect of Introducing β-FeSi2Template Layers on Defect Density and Minority Carrier Diffusion Length in Si Region near p-β-FeSi2/n-Si Heterointerface)

Hideki Kawakami, Mitsushi Suzuno, Keiichi Akutsu, Jun Chen, Karolin Jiptner, Takashi Sekiguchi, Takashi Suemasu.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2016-05-24 16:35:58 +0900 Updated at: 2026-11-09 05:03:42 +0900

    ▲ Go to the top of this page