HOME > Article > DetailHybrid density functional analysis of distribution of carbon-related defect levels at 4H-SiC(0001)/SiO2 interfaceTomoaki Kaneko, Nobuo Tajima, Takahiro Yamasaki, Jun Nara, Tatsuo Schimizu, Koichi Kato, Takahisa Ohno. Applied Physics Express 11 [1] 011302. 2018.https://doi.org/10.7567/apex.11.011302 NIMS author(s)NARA, JunFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-12-12 20:45:06 +0900Updated at: 2024-04-01 21:37:01 +0900