HOME > Article > DetailChange of Electrical Properties of Rutile- and Anatase-TiO2 Films by Atomic Layer Deposited Al2O3(Change of Electrical Properties of Rutile- and Anatase-TiO2 Films By Atomic Layer Deposited Al2O3)Toshihide Nabatame, Ippei Yamamoto, Tomomi Sawada, Akihiko Ohi, Thang Duy Dao, Tomoji Ohishi, Tadaaki Nagao. ECS Transactions 92 [3] 15-21. 2019.https://doi.org/10.1149/09203.0015ecst NIMS author(s)NABATAME, ToshihideOHI, AkihikoNAGAO, TadaakiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2019-10-22 03:04:18 +0900Updated at: 2025-01-09 04:50:37 +0900