Interface trap characterization of Al2O3/GaN vertical-type MOS capacitors on GaN substrate with surface treatments
| 著者 | Bing Ren, Yue Shen, Xinke Liu, Masatomo Sumiya, Yasuo Koide, Bing Ren, Meiyong Liao, SUMIYA, Masatomo, LIAO, Meiyong, Liwen Sang, KOIDE, Yasuo, Xinke Liu, Yue Shen, SANG, Liwen. |
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| 掲載誌名 | Journal of Alloys and Compounds 767 600-605 ISSN: 09258388 ESIでのカテゴリ: MATERIALS SCIENCE |
| 出版社 | Elsevier BV |
| 発表年 | 2018 |
| 言語 | English |