Interface trap characterization of Al2O3/GaN vertical-type MOS capacitors on GaN substrate with surface treatments
著者 | Bing Ren, Yue Shen, Xinke Liu, Masatomo Sumiya, Yasuo Koide, Bing Ren, Meiyong Liao, SUMIYA, Masatomo, LIAO, Meiyong, Liwen Sang, KOIDE, Yasuo, Xinke Liu, Yue Shen, SANG, Liwen. |
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掲載誌名 | Journal of Alloys and Compounds 767 600-605 ISSN: 09258388 ESIでのカテゴリ: MATERIALS SCIENCE |
出版社 | Elsevier BV |
発表年 | 2018 |
言語 | English |