HOME > 論文 > 書誌詳細Structural analysis of Si-doped amorphous In2O3 based on quantum beam measurements and computer simulationsYuta Shuseki, Akihiko Fujiwara, Nobuhiko Mitoma, Takio Kizu, Toshihide Nabatame, Kazuhito Tsukagoshi, Yohei Onodera, Atsunobu Masuno, Koji Ohara, Shinji Kohara. Scientific Reports 15 [1] 36662. 2025.https://doi.org/10.1038/s41598-025-20384-0 Open Access Springer Science and Business Media LLC (Publisher) Materials Data Repository (MDR) NIMS著者生田目 俊秀塚越 一仁小野寺 陽平小原 真司Materials Data Repository (MDR)上の本文・データセットMDRavailable Structural analysis of Si-doped amorphous In2O3 based on quantum beam measurements and computer simulations 作成時刻: 2025-10-23 03:08:51 +0900 更新時刻: 2025-12-25 04:47:10 +0900
