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Structural analysis of Si-doped amorphous In2O3 based on quantum beam measurements and computer simulations

Yuta Shuseki, Akihiko Fujiwara, Nobuhiko Mitoma, Takio Kizu, Toshihide Nabatame, Kazuhito Tsukagoshi, Yohei Onodera, Atsunobu Masuno, Koji Ohara, Shinji Kohara.

Scientific Reports 15 [1] 36662. 2025.

https://doi.org/10.1038/s41598-025-20384-0

Open Access Springer Science and Business Media LLC (Publisher) Materials Data Repository (MDR)

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

MDRavailable Structural analysis of Si-doped amorphous In2O3 based on quantum beam measurements and computer simulations

Created at: 2025-10-23 03:08:51 +0900 Updated at: 2026-09-03 04:48:29 +0900

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