HOME > 論文 > 書誌詳細Determining the Electron Scattering from Interfacial Coulomb Scatterers in Two-Dimensional TransistorsYi-Te Lee, Yu-Ting Huang, Shao-Pin Chiu, Ruey-Tay Wang, Takashi Taniguchi, Kenji Watanabe, Raman Sankar, Chi-Te Liang, Wei-Hua Wang, Sheng-Shiuan Yeh, Juhn-Jong Lin. ACS Applied Materials & Interfaces 16 [1] 1066-1073. 2024.https://doi.org/10.1021/acsami.3c14312 Open Access American Chemical Society (ACS) (Publisher) Materials Data Repository (MDR) NIMS著者谷口 尚渡邊 賢司Materials Data Repository (MDR)上の本文・データセットMDRavailable Determining the Electron Scattering from Interfacial Coulomb Scatterers in Two-Dimensional Transistors 作成時刻: 2024-01-24 03:10:03 +0900 更新時刻: 2026-03-01 08:53:51 +0900
