Determining the Electron Scattering from Interfacial Coulomb Scatterers in Two-Dimensional Transistors

Yi-Te Lee; Yu-Ting Huang; Shao-Pin Chiu; Ruey-Tay Wang; Takashi Taniguchi; Kenji Watanabe; Raman Sankar; Chi-Te Liang; Wei-Hua Wang; Sheng-Shiuan Yeh; Juhn-Jong Lin; Yi-Te Lee; Yu-Ting Huang; Shao-Pin Chiu; Ruey-Tay Wang; Takashi Taniguchi; Kenji Watanabe; Raman Sankar; Chi-Te Liang; Wei-Hua Wang; Sheng-Shiuan Yeh; Juhn-Jong Lin

doi:10.1021/acsami.3c14312

Determining the Electron Scattering from Interfacial Coulomb Scatterers in Two-Dimensional Transistors

Yi-Te Lee, Yu-Ting Huang, Shao-Pin Chiu, Ruey-Tay Wang, Takashi Taniguchi, Kenji Watanabe, Raman Sankar, Chi-Te Liang, Wei-Hua Wang, Sheng-Shiuan Yeh, Juhn-Jong Lin.

ACS Applied Materials & Interfaces 16 [1] 1066-1073. 2024.

https://doi.org/10.1021/acsami.3c14312

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2024-01-24 03:10:03 +0900Updated at: 2024-11-14 08:45:01 +0900