Determining the Electron Scattering from Interfacial Coulomb Scatterers in Two-Dimensional Transistors

Yi-Te Lee; Yu-Ting Huang; Shao-Pin Chiu; Ruey-Tay Wang; Takashi Taniguchi; Kenji Watanabe; Raman Sankar; Chi-Te Liang; Wei-Hua Wang; Sheng-Shiuan Yeh; Juhn-Jong Lin; Yi-Te Lee; Yu-Ting Huang; Shao-Pin Chiu; Ruey-Tay Wang; Takashi Taniguchi; Kenji Watanabe; Raman Sankar; Chi-Te Liang; Wei-Hua Wang; Sheng-Shiuan Yeh; Juhn-Jong Lin

doi:10.1021/acsami.3c14312

Determining the Electron Scattering from Interfacial Coulomb Scatterers in Two-Dimensional Transistors

Yi-Te Lee, Yu-Ting Huang, Shao-Pin Chiu, Ruey-Tay Wang, Takashi Taniguchi, Kenji Watanabe, Raman Sankar, Chi-Te Liang, Wei-Hua Wang, Sheng-Shiuan Yeh, Juhn-Jong Lin.

ACS Applied Materials & Interfaces 16 [1] 1066-1073. 2024.

https://doi.org/10.1021/acsami.3c14312

Open Access American Chemical Society (ACS) (Publisher) Materials Data Repository (MDR)

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

MDRavailable Determining the Electron Scattering from Interfacial Coulomb Scatterers in Two-Dimensional Transistors

Created at: 2024-01-24 03:10:03 +0900 Updated at: 2026-01-29 07:15:07 +0900