Overestimation of Operational Stability in Polymer-Based Organic Field-Effect Transistors Caused by Contact Resistance | SAMURAI, NIMS Researchers Directory Service

HOME > Article > Detail

Overestimation of Operational Stability in Polymer-Based Organic Field-Effect Transistors Caused by Contact Resistance

Kenji Sakamoto, Takeshi Yasuda, Takeo Minari, Masafumi Yoshio, Junpei Kuwabara, Masayuki Takeuchi.

ACS Applied Materials & Interfaces 16 [49] 68081-68090. 2024.

https://doi.org/10.1021/acsami.4c15666

Open Access American Chemical Society (ACS) (Publisher) Materials Data Repository (MDR)

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

MDRavailable Overestimation of Operational Stability in Polymer-Based Organic Field-Effect Transistors Caused by Contact Resistance

Created at: 2024-12-13 03:16:33 +0900 Updated at: 2026-10-04 04:48:38 +0900

▲ Go to the top of this page