HOME > 論文 > 書誌詳細Direct feature extraction from two-dimensional X-ray diffraction images of semiconductor thin films for fabrication analysisAkihiro Yamashita, Takahiro Nagata, Shinjiro Yagyu, Toru Asahi, Toyohiro Chikyow. Science and Technology of Advanced Materials: Methods 2 [1] 23-37. 2022.https://doi.org/10.1080/27660400.2022.2029222 Open Access Informa UK Limited (Publisher) NIMS著者長田 貴弘柳生 進二郎知京 豊裕Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-04-23 03:26:00 +0900 更新時刻: 2026-10-08 06:56:25 +0900
