HOME > 論文 > 書誌詳細Characterization of a 4-inch GaN wafer by X-ray diffraction topographyJaemyung Kim, Okkyun Seo, Chulho Song, Yanna Chen, Satoshi Hiroi, Yoshihiro Irokawa, Toshihide Nabatame, Yasuo Koide, Osami Sakata. CrystEngComm 20 [48] 7761-7765. 2018.https://doi.org/10.1039/c8ce01440j Open Access Royal Society of Chemistry (RSC) (Publisher) NIMS著者色川 芳宏生田目 俊秀小出 康夫Materials Data Repository (MDR)上の本文・データセット作成時刻: 2019-03-01 11:45:26 +0900更新時刻: 2024-10-06 05:16:49 +0900
