HOME > 論文 > 書誌詳細Correlation between ferroelectricity and ferroelectric orthorhombic phase of HfxZr1−xO2 thin films using synchrotron x-ray analysisTakashi Onaya, Toshihide Nabatame, Yong Chan Jung, Heber Hernandez-Arriaga, Jaidah Mohan, Harrison Sejoon Kim, Naomi Sawamoto, Chang-Yong Nam, Esther H. R. Tsai, Takahiro Nagata, Jiyoung Kim, Atsushi Ogura. APL Materials 9 [3] 031111. 2021.https://doi.org/10.1063/5.0035848 Open Access AIP Publishing (Publisher) NIMS著者生田目 俊秀長田 貴弘Materials Data Repository (MDR)上の本文・データセット作成時刻: 2021-04-16 03:00:17 +0900更新時刻: 2024-03-31 12:51:45 +0900
