HOME > 論文 > 書誌詳細Mapping of a Lattice-Plane Tilting in a GaN Wafer Using Energy-Resolved X-Ray Diffraction TopographyJaemyung Kim, Okkyun Seo, Chulho Song, Satoshi Hiroi, Yanna Chen, Yoshihiro Irokawa, Toshihide Nabatame, Yasuo Koide, Osami Sakata. Physical Review Applied 11 [2] 024072. 2019.https://doi.org/10.1103/physrevapplied.11.024072 Open Access American Physical Society (APS) (Publisher) NIMS著者色川 芳宏生田目 俊秀小出 康夫Materials Data Repository (MDR)上の本文・データセット作成時刻: 2019-03-14 00:39:01 +0900更新時刻: 2025-01-09 05:09:35 +0900
