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Thickness- and orientation- dependences of Curie temperature in ferroelectric epitaxial Y doped HfO2 films

Takanori Mimura, Takao Shimizu, Yoshio Katsuya, Osami Sakata, Hiroshi Funakubo.
Japanese Journal of Applied Physics 59 [SG] SGGB04. 2020.
https://doi.org/10.35848/1347-4065/ab6d84

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