SAMURAI - NIMS Researchers Database

HOME > Article > Detail

Thickness- and orientation- dependences of Curie temperature in ferroelectric epitaxial Y doped HfO2 films

Takanori Mimura, Takao Shimizu, Yoshio Katsuya, Osami Sakata, Hiroshi Funakubo.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2020-03-11 03:00:18 +0900Updated at: 2024-10-11 04:31:09 +0900

    ▲ Go to the top of this page