HOME > Article > DetailThickness- and orientation- dependences of Curie temperature in ferroelectric epitaxial Y doped HfO2 filmsTakanori Mimura, Takao Shimizu, Yoshio Katsuya, Osami Sakata, Hiroshi Funakubo. Japanese Journal of Applied Physics 59 [SG] SGGB04. 2020.https://doi.org/10.35848/1347-4065/ab6d84 NIMS author(s)SHIMIZU, TakaoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2020-03-11 03:00:18 +0900Updated at: 2024-10-11 04:31:09 +0900