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Thickness- and orientation- dependences of Curie temperature in ferroelectric epitaxial Y doped HfO2 films

Takanori Mimura, Takao Shimizu, Yoshio Katsuya, Osami Sakata, Hiroshi Funakubo.

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Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2020-03-11 03:00:18 +0900Updated at: 2024-05-03 05:19:17 +0900

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