HOME > 論文 > 書誌詳細Thickness- and orientation- dependences of Curie temperature in ferroelectric epitaxial Y doped HfO2 filmsTakanori Mimura, Takao Shimizu, Yoshio Katsuya, Osami Sakata, Hiroshi Funakubo. Japanese Journal of Applied Physics 59 [SG] SGGB04. 2020.https://doi.org/10.35848/1347-4065/ab6d84 NIMS著者清水 荘雄Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-03-11 03:00:18 +0900更新時刻: 2024-04-02 00:45:51 +0900
