Electrically Self-Aligned, Reconfigurable Test Structure Using WSe2/SnSe2 Heterojunction for TFET and MOSFET
(Electrically self-aligned, reconfigurable WSe2/SnSe2 heterojunction for p-tunnel FET and n-MOSFET applications)

著者	Pushkar Dasika, Kenji Watanabe, Takashi Taniguchi, Kausik Majumdar.
掲載誌名	IEEE Transactions on Electron Devices 69 [9] 5377-5381 ISSN: 00189383, 15579646 ESIでのカテゴリ: ENGINEERING
出版社	Institute of Electrical and Electronics Engineers (IEEE)
発表年	2022
言語	English
DOI	https://doi.org/10.1109/ted.2022.3191991
この文献をMendeleyにインポート