HOME > Article > DetailElectrically Self-Aligned, Reconfigurable Test Structure Using WSe2/SnSe2 Heterojunction for TFET and MOSFET(Electrically self-aligned, reconfigurable WSe2/SnSe2 heterojunction for p-tunnel FET and n-MOSFET applications)Pushkar Dasika, Kenji Watanabe, Takashi Taniguchi, Kausik Majumdar. IEEE Transactions on Electron Devices 69 [9] 5377-5381. 2022.https://doi.org/10.1109/ted.2022.3191991 NIMS author(s)WATANABE, KenjiTANIGUCHI, TakashiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2022-08-30 03:27:37 +0900Updated at: 2024-04-02 05:24:02 +0900