Alfred J. H. Jones; Ryan Muzzio; Paulina Majchrzak; Sahar Pakdel; Davide Curcio; Klara Volckaert; Deepnarayan Biswas; Jacob Gobbo; Simranjeet Singh; Jeremy T. Robinson; Kenji Watanabe; Takashi Taniguchi; Timur K. Kim; Cephise Cacho; Nicola Lanata; Jill A. Miwa; Philip Hofmann; Jyoti Katoch; Søren Ulstrup

doi:10.1002/adma.202001656

Observation of Electrically Tunable van Hove Singularities in Twisted Bilayer Graphene from NanoARPES

著者	Alfred J. H. Jones, Ryan Muzzio, Paulina Majchrzak, Sahar Pakdel, Davide Curcio, Klara Volckaert, Deepnarayan Biswas, Jacob Gobbo, Simranjeet Singh, Jeremy T. Robinson, Kenji Watanabe, Takashi Taniguchi, Timur K. Kim, Cephise Cacho, Nicola Lanata, Jill A. Miwa, Philip Hofmann, Jyoti Katoch, Søren Ulstrup.
掲載誌名	Advanced Materials 32 [31] 2001656 ISSN: 15214095, 09359648 ESIでのカテゴリ: MATERIALS SCIENCE
出版社	Wiley
発表年	2020
言語	English
DOI	https://doi.org/10.1002/adma.202001656
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