Observation of Electrically Tunable van Hove Singularities in Twisted Bilayer Graphene from NanoARPES

Alfred J. H. Jones; Ryan Muzzio; Paulina Majchrzak; Sahar Pakdel; Davide Curcio; Klara Volckaert; Deepnarayan Biswas; Jacob Gobbo; Simranjeet Singh; Jeremy T. Robinson; Kenji Watanabe; Takashi Taniguchi; Timur K. Kim; Cephise Cacho; Nicola Lanata; Jill A. Miwa; Philip Hofmann; Jyoti Katoch; Søren Ulstrup; Alfred J. H. Jones; Ryan Muzzio; Paulina Majchrzak; Sahar Pakdel; Davide Curcio; Klara Volckaert; Deepnarayan Biswas; Jacob Gobbo; Simranjeet Singh; Jeremy T. Robinson; Kenji Watanabe; Takashi Taniguchi; Timur K. Kim; Cephise Cacho; Nicola Lanata; Jill A. Miwa; Philip Hofmann; Jyoti Katoch; Søren Ulstrup

doi:10.1002/adma.202001656

Observation of Electrically Tunable van Hove Singularities in Twisted Bilayer Graphene from NanoARPES

Alfred J. H. Jones, Ryan Muzzio, Paulina Majchrzak, Sahar Pakdel, Davide Curcio, Klara Volckaert, Deepnarayan Biswas, Jacob Gobbo, Simranjeet Singh, Jeremy T. Robinson, Kenji Watanabe, Takashi Taniguchi, Timur K. Kim, Cephise Cacho, Nicola Lanata, Jill A. Miwa, Philip Hofmann, Jyoti Katoch, Søren Ulstrup.

Advanced Materials 32 [31] 2001656. 2020.

https://doi.org/10.1002/adma.202001656

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2020-08-25 03:00:19 +0900Updated at: 2024-03-31 00:54:03 +0900