HOME > 論文 > 書誌詳細Threshold Voltage Instability of Diamond Metal–Oxide–Semiconductor Field‐Effect Transistors Based on 2D Hole GasMingchao Yang, Liwen Sang, Meiyong Liao, Masataka Imura, Hongdong Li, Yasuo Koide. physica status solidi (a) 216 [24] 1900538. 2019.https://doi.org/10.1002/pssa.201900538 NIMS著者廖 梅勇井村 将隆小出 康夫Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-06-03 03:00:21 +0900更新時刻: 2024-10-06 05:28:39 +0900
