HOME > Article > DetailThreshold Voltage Instability of Diamond Metal–Oxide–Semiconductor Field‐Effect Transistors Based on 2D Hole GasMingchao Yang, Liwen Sang, Meiyong Liao, Masataka Imura, Hongdong Li, Yasuo Koide. physica status solidi (a) 216 [24] 1900538. 2019.https://doi.org/10.1002/pssa.201900538 NIMS author(s)SANG, LiwenLIAO, MeiyongIMURA, MasatakaKOIDE, YasuoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2020-06-03 03:00:21 +0900Updated at: 2024-03-31 01:15:03 +0900