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Threshold Voltage Instability of Diamond Metal–Oxide–Semiconductor Field‐Effect Transistors Based on 2D Hole Gas

Mingchao Yang, Liwen Sang, Meiyong Liao, Masataka Imura, Hongdong Li, Yasuo Koide.
physica status solidi (a) 216 [24] 1900538. 2019.
https://doi.org/10.1002/pssa.201900538

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