SAMURAI - NIMS Researchers Database

HOME > Article > Detail

Threshold Voltage Instability of Diamond Metal–Oxide–Semiconductor Field‐Effect Transistors Based on 2D Hole Gas

Mingchao Yang, Liwen Sang, Meiyong Liao, Masataka Imura, Hongdong Li, Yasuo Koide.
physica status solidi (a) 216 [24] 1900538. 2019.

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

    Created at: 2020-06-03 03:00:21 +0900Updated at: 2024-06-02 05:00:33 +0900

    ▲ Go to the top of this page