HOME > 論文 > 書誌詳細Synchrotron X-ray diffraction characterization of the inheritance of GaN homoepitaxial thin films grown on selective growth substratesYanfang Lou, Chulho Song, Yanna Chen, Loku Singgappulige Rosantha Kumara, Natalia Palina, Okkyun Seo, Satoshi Hiroi, Kentaro Kajiwara, Masato Hoshino, Kentaro Uesugi, Yoshihiro Irokawa, Toshihide Nabatame, Yasuo Koide, Osami Sakata. CrystEngComm 20 [20] 2861-2867. 2018.https://doi.org/10.1039/c8ce00229k Open Access Royal Society of Chemistry (RSC) (Publisher) NIMS著者色川 芳宏生田目 俊秀小出 康夫Materials Data Repository (MDR)上の本文・データセット作成時刻: 2018-05-23 21:06:56 +0900更新時刻: 2024-10-05 05:42:46 +0900
