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Center for Basic Research on Materials, Advanced Materials Characterization Field, Nanoprobe Group: 9 researcher(s) found.
Sorted by the alphabetical order. Displaying from 1 to 9.

アリクル バルケイ マリヤ (AREECKAL VARKEY, Mariya)

Graduate Research Assistant, Nanoprobe Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

CHAKRABORTY, Madhuparna (チャクラボルティー マドゥパルナ)

Postdoctoral Research Fellow, Nanoprobe Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

CUSTANCE, Oscar (クスタンセ オスカル)

Managing Researcher, Center for Basic Research on Materials

Keywords

high-resolution atomic force microscopy, scanning tunneling microscopy

HAYASHI, Hironobu (林 宏暢)

Principal Researcher, Nanoprobe Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords

有機合成、表面化学合成、有機デバイス、自己組織化

ISHIDA, Nobuyuki (石田 暢之)

Principal Researcher, Nanoprobe Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

KAWAI, Shigeki (川井 茂樹)

Group Leader, Nanoprobe Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords

High resolution atomic force microscopy for surface chemistry

KOMEDA, Tadahiro (米田 忠弘)

Specially Appointed Research Fellow, Nanoprobe Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

LI, Donglin (リ ドンリン)

Nanoprobe Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

TSUJI, Haruka (辻 遥)

Nanoprobe Group, Advanced Materials Characterization Field, Center for Basic Research on Materials