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Executive / Research fellows: 6 researcher(s) found.
Sorted by the alphabetical order. Displaying from 1 to 6.

CUSTANCE, Oscar

CUSTANCE, Oscar (クスタンセ オスカル)

Managing Researcher, Center for Basic Research on Materials

Keywords

high-resolution atomic force microscopy, scanning tunneling microscopy

HAYASHI, Hironobu

HAYASHI, Hironobu (林 宏暢)

Senior Researcher, Nanoprobe Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords

有機合成、表面化学合成、有機デバイス、自己組織化

ISHIDA, Nobuyuki

ISHIDA, Nobuyuki (石田 暢之)

Principal Researcher, Nanoprobe Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

KAWAI, Shigeki

KAWAI, Shigeki (川井 茂樹)

Group Leader, Nanoprobe Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords

High resolution atomic force microscopy for surface chemistry

SAGISAKA, Keisuke

SAGISAKA, Keisuke (鷺坂 恵介)

Principal Researcher, Nanoprobe Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords

走査トンネル顕微鏡、金属・半導体表面、原子分解能観察

YOSHIZAWA, Shunsuke

YOSHIZAWA, Shunsuke (吉澤 俊介)

Senior Researcher, Nanoprobe Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords

低温物性、表面科学、走査トンネル顕微鏡

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