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最終更新時刻: 2026-10-02 04:30:43 +0900

1 article(s) found. Sorted by publication dates. (Help)
  • UMEZAWA, Naoto, Kenji Shiraishi , Yasushi Akasaka, Seiji Inumiya, Akira Uedeno , Seiichi Miyazaki , CHIKYOW, Toyohiro, OHNO, Takahisa, Yasuo Nara, Keisaku Yamada . Reduction in Oxygen Vacancy Formation Energy Caused by Nitrogen Incorporation in Hf-based High-k Gate Dielectrics. SISC ABSTRACT. (2005) 8.3

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