HOME > 会議録 > 書誌詳細Bias-application in Hard X-ray Photoelectron Spectroscopy for Characterization of Advanced MaterialsYAMASHITA, Yoshiyuki, Ohmori Kenji, UEDA, Shigenori, YOSHIKAWA, Hideki, CHIKYOW, Toyohiro, KOBAYASHI, Keisuke. e-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY 81-83. 2010.NIMS著者山下 良之上田 茂典吉川 英樹知京 豊裕Materials Data Repository (MDR)上の本文・データセット作成時刻 :2017-02-27 01:46:58 +0900 更新時刻 :2017-03-17 03:51:04 +0900