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Atomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron Microscope

Peng Wang, Angus I. Kirkland, Peter D. Nellist, Adrian J. D’Alfonso, Andrew J. Morgan, Leslie J. Allen, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi, Masayuki Shimojo.

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Materials Data Repository (MDR)上の本文・データセット


    作成時刻: 2017-02-27 02:34:29 +0900更新時刻: 2024-04-01 22:30:58 +0900

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