HOME > 会議録 > 書誌詳細Atomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron MicroscopePeng Wang, Angus I. Kirkland, Peter D. Nellist, Adrian J. D’Alfonso, Andrew J. Morgan, Leslie J. Allen, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi, Masayuki Shimojo. Proceedings Microscopy & Microanalysis 2014 376-377. 2014.https://doi.org/10.1017/s1431927614003602 NIMS著者橋本 綾子竹口 雅樹三石 和貴Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-27 02:34:29 +0900更新時刻: 2024-10-10 05:10:45 +0900
