HOME > Proceedings > DetailAtomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron MicroscopePeng Wang, Angus I. Kirkland, Peter D. Nellist, Adrian J. D’Alfonso, Andrew J. Morgan, Leslie J. Allen, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi, Masayuki Shimojo. Proceedings Microscopy & Microanalysis 2014 376-377. 2014.https://doi.org/10.1017/s1431927614003602 NIMS author(s)HASHIMOTO, AyakoTAKEGUCHI, MasakiMITSUISHI, KazutakaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-27 02:34:29 +0900Updated at: 2024-04-01 22:30:58 +0900