HOME > Presentation > DetailBias Dependent Potential of High-k thin films obtained from Operando Photoelectron Spectroscopy山下 良之, 吉川 英樹, 知京 豊裕. The 31st European Conference on Surface Science. 2015.NIMS author(s)YAMASHITA, YoshiyukiYOSHIKAWA, HidekiCHIKYO, ToyohiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 10:55:45 +0900Updated at: 2017-07-10 22:12:49 +0900